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N5244A Keysight N5244A PNA-X Microwave Network Analyzer,

产品信息

N5244A PNA-X Microwave Network Analyzer, 43.5 GHz    

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Key Features and Functions

  • Reach for unrivaled excellence in your measurements and designs
  • Simplify your test stations by replacing racks and stacks of equipment
  • Increase productivity with the most integrated and flexible single-connection microwave test engine
  • Reduce test time with the world’s widest range of single-connection measurement applications
  • Test linear and nonlinear device characterization more accuray with the world’s best PNA-X
aximum Frequency43.5 GHz
Dynamic Range124 dB
Output Power13 dBm
Trace Noise0.002 dBrms
Number of Built-In Ports2 or 4 ports
Harmonics-60 dBc
Noise Floor-111 dBm
Best Speed at 201 Point, 1 Sweep5.5 ms
Network Analyzer SeriesPNA-X Most Advanced and Flexible
Applications
  • S-Parameters
  • Noise Figure
  • Gain Compression
  • X-Parameters
  • Balance Measurements
  • Pulsed RF
  • IMD
Components
  • Antennas
  • Mixers/Frequency Converters
  • Amplifiers
BenchtopYes                                                            
 

 

Measuring Group Delay of Frequency Converters with Embedded LO
Measuring Power-Added Efficiency (PAE) with PNA Network Analyzers (1408-16) – Application Note
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20

This application note discusses the unique challenges involved in minimizing noise figure.

Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note

Shows a cold-source solution based on the Keysight PNA-X microwave network analyzer. When equipped with the optional source-corrected NF measurements (Option 029), the PNA-X provides accuracy.

Application of Keysight's PNA-X NVNA and X-Parameters in Power Amplifier Design

This 16-page article appeared in Microwave Journal's May 2011 issue; teaches you how to obtain actual linear and nonlinear component behavior to improve power amplifier design using Keysight's solutions.

Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note

This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

High Power Amplifier Measurements Using Keysight's Nonlinear Vector Network Analyzers AN 1408-19

This application note discusses the unique challenges involved in testing high-power devices using Keysight's N5242A nonlinear vector network analyzer(NVNA).

Total Analysis Environment for Modeling

Keysight IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.

Evaluating X-parameter Models for Active Device Nonlinear Behavior (AN 1408-22)

This AN examines three different modeling techniques that can be used to capture nonlinear behavior in a PA: the more conventional S2D and P2D, and the more recently commercialize X-parameter model.

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