Dynamic Bending Tester

Dynamic Bending Tester

The Dynamic Bending Tester is designed to simultaneously test 5 cards in accordance with ISO 10373-1. IC cards are expected to remain functional after a total of 2000 bending cycles – and 4000 cycles without breaking apart. The P-13 can also be set to any user defined number of cycles. Automatically stops test once number of test cycles selected is reached.

·Power: 110-220V 50-60Hz.

·Standard Ref: ISO 7810, 10373-1

·CQM Test Ref: P-13

·Test Method: CQM 10.3.13

· CQM §: 5.1.13, 6.1.11 16.1.18.1

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