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美国GGB探针Model 67A

产品信息
  •  High Performance Microwave Probes


     Model 67A

     

    Features
     

    • Coplanar probe tips
    • Any pitch from 25 to 1250 microns
    • Durable
    • DC to 67 GHz
    • Insertion loss less than 1.1db
    • Return loss greater than 14db
    • Measurement repeatability -80db
    • Individually spring loaded contacts
    • BeCu or Tungsten tips available
    • Variety of Footprints
    • Patented coaxial design
    • Available in thirteen styles
    • Custom configurations available

     

                    
         

               FIGURE 1

     

    A coplanar probe with patented flexible tips, the MODEL 67A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 67A achieves an insertion loss of less than 1.1 db and a return loss of greater than 14 db through 67 GHz.

     

    With its individually spring loaded, Beryllium-Copper or optional Tungsten tips, the Picoprobe® Model 67A microwave probe provides reliable contacts, even when probing non-planar structures. This reliable low resistance contact is one of the keys to providing highly repeatable measurements. The Model 67A also provides direct viewing of the probe tips for accurate positioning.

     

    The Model 67A can be mounted in various adaptors for use with standard microwave probe stations. Custom mounts are available.

     

    Any pitch (tip spacing) from 25 to 1250 microns may be specified. The probe can be configured with Ground-Signal-Ground (G,S,G), Ground-Signal (G,S), or Signal-Ground (S,G) tip footprints. We recommend smaller pitches with a G,S,G footprint for best results.

     

     

     

    Connection to the Model 67A is through a female V connector.

     

    Flexible Tips for Flexible Probing

     

    Each Model 67A has patented, independently spring loaded tips which make contact to the probing surface. Because the tips are flexible they minimize circuit damage, increase probe life, and most importantly, provide a reliable individually spring loaded contact for each point. With a small amount of overdrive, the point scrubs the surface to make a reliable contact free of dust, dirt, and oxide contamination. The ability to view the exact contact area eases probe positioning and allows for the precise positioning necessary for good LRM calibrations. The flexible tips even allow probing of non-planar surfaces such as ceramic substrates and laser diode structures.

     

    Coaxial Transmission Improves Performance

    The Model 67A uses a precision miniature 50 ohm coaxial cable from the probe tips to the connector interface. The coaxial design provides lower loss and less radiation than traditional coplanar designs. The miniature coaxial cable is fabricated from flexible Beryllium-Copper which greatly improves the probe’s durability.

     

    Probe Cards

    Model 67A probes can be mounted on both standard 4.5 inch probe cards and custom-sized probe cards to provide a convenient method for testing wafers at high frequencies using standard automatic or manual probe stations. Picoprobe Probe Cards combine our Model 67A probe technology for RF connections with DC needles for power and low frequency signals.

     

    Multi-Contact Wedges

    Our unique Multi-Contact Wedge designs accommodate multiple RF and DC contacts on a single, compact adapter. This compact design provides the user with a convenient method for testing wafers at high frequencies using standard automatic or manual probe stations. The user can choose from a variety of wiring options for the DC or power needles and select any combination of 40, 50, 67, and/or 110 GHz RF probes. 

     

                

     

     

     

     

     

     
     

     

     

    Line of Microwave Probes

    An entire line of microwave probes are available with standard tip spacings of up to 2540 microns. Larger tip spacings are available as well. For special applications, the Model 67A can be mounted in custom adaptors, the coaxial line can be bent to fit tight spaces, and the tips can be configured to match extremely non-planar surfaces or non-symmetrically placed grounds.

    Other options include:
    Tungsten or Nickel probe tips; 
    high temperature and high power versions; 
    custom "chip" probes which have integrated series, parallel or termination components built into the signal tip.

    For applications below 40 GHz, GGB Industries, Inc., offers the Model 40A Picoprobe which uses the 2.9mm K connector. The Model 40A performs up to 40 GHz with less than 0.8 db insertion loss and return loss of greater than 18 db.

    For applications above 50 GHz, GGB Industries, Inc., offers a complete line of microwave probes operating up to 325 GHz (Model 325). Several models are available with wave guide inputs: WR-22 for 33 to 50 GHz, WR-15 for 50 to 75 GHz, WR-12 for 60 to 90 GHz, WR-10 for 75 to 120 GHz, WR-8 for 90 to 140 GHz, WR-5 for 140 to 220 GHz, and WR-3 for 325 GHz. The wave guide probes have an optional integral Bias T for active device measurements.  Many other types and custom designs are available, so please call with your special application requirements.

    Probing Expertise

    With more than 25 years of probing experience, GGB Industries has broad capabilities in custom probe engineering and manufacturing. Our staff is accustomed to creating unique solutions for the most difficult probing requirements demanded by our customers. GGB Industries, Inc., is the leading supplier of high impedance active probes offering models with input capacitances of as low as .02 pF and frequency responses of up to 26.0 GHz. 

      ORDERING INFORMATION

    When ordering Model 67A probes, use the following part numbering convention:

    Model 67A - configuration - pitch - mounting style
    ORDERING INFORMATION

    When ordering Picoprobe Model 40A probes, use the following part numbering convention:

    Configuration: Specify GSG, GS or SG for tip placement where S is the signal tip and G is a ground tip. Use the following diagram to determine the appropriate configuration. 


    Pitch: Specify ground (G) to signal (S) tip spacing in Microns from 50 to 1250 microns. For standard GSG probes, the two spacings are equal. Contact the factory for spacings larger than 1250 microns or unusual tip placement and spacings.

     

     

    Mounting Style: Choose from thirteen adapter styles. Specify T, C, GR, P, DP, EDP, LP, Q, F, S, DS, VP, or RVP. Choose the appropriate mounting type for your application. The P, DP, EDP, LP, Q, S, DS, VP, and RVP styles have the connector pointing back at a 45 degree angle to give more working area above the probe. The DP, EDP, DS, VP, and RVP styles are used where extra clearance beneath the probe is needed. When using DP, EDP, and DS style probes, probe positioning is more difficult due to the increased probing angle since the probe points slide further forward for a given change in the Z axis than our other style probes. Custom mounting styles are available 

    Example:A 67A-GSG-150-P is a Model 67A with Ground, Signal, Ground configuration with 150 microns between each contact mounted in a P style adaptor.
     

     
























     



     





     

     


     

     

     

    公司简介

        深圳市森东宝科技有限公司(Cindbest)是香港森东宝国际有限公司在大陆的全资子公司,其致力于半导体技术的共享事业,专注于促进ZG半导体行业的快速成长,以为客户提供性价比的测试系统为使命。 
        森东宝目前设有半导体仪器营销事业部和半导体设备制造工厂。自主研发CINDBEST品Pai探针台、激光修复仪、探针台全部配件、集代理半导体测试仪表的综合型厂家。现以优质的产品性能,高标准的售后服务迎得客户的广泛认可,是行业内值得信赖的产品供应与服务商。 

        深圳市森东宝科技有限公司现服务于60多家研究所和高校。与高校、研究所、考古、半导体电子检测等领域有着稳定的合作关系。

        合作过的部分客户: 清华大学、北京大学、南京邮电大学、中山大学、华侨大学、深圳大学、湖北大学、燕山大学、ZG矿业大学、西北大学、华南师范大学、苏州大学、北京理工大学、上海师范大学、山东大学、华中科技大学、厦门大学、南京航空航天大学、北京航空航天大学、清华大学深圳研究生院、北京大学深圳研究生院、上海交大密西根学院、江南大学、东南大学、中科院物理所、中科院半导体所、中电48所、中电38所等。

     

     

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