美国GGB探针 Model 50A原装进口，射频探ZX代理商
- 产地：中国大陆
- 供应商：深圳市森东宝科技有限公司
- 供应商报价：电议
- 标签：美国GGB探针 Model 50A原装进口，射频探中心代理商,光学仪器,配件耗材,供应美国GGB探针 Model 50A原装进口，射频探中心代理商,深圳市森东宝科技有限公司
产品库
High Performance Microwave Probes
Model 50A
| Features
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| Flexible Tips for Flexible Probing Each Model 50A has patented, independently spring loaded tips. Because the tips are flexible they minimize circuit damage, increase probe life, ａnd most importantly, provide a reliable individually spring loaded contact for each point. With a small amount of overdrive, the point scrubs the surface to make a reliable contact free of dust, dirt, ａnd oxide contamination. The ability to view the exact contact area eases probe positioning ａnd allows for the precise positioning necessary for good LRM calibrations. The flexible tips even allow probing of non-planar surfaces such as ceramic substrates ａnd laser diode structures.
Coaxial Transmission Improves Performance The Model 50A uses a precision miniature 50 ohm coaxial cable from the probe tips to the connector interface. The coaxial design provides lower loss ａnd less radiation than coplanar designs. The miniature coaxial cable is fabricated from flexible Beryllium-Copper which greatly improves the probe’s durability.
Probe Cards The Model 50A as well as all of our RF probes can be mounted on standard 4.5 inch probe cards and/or custom-sized cards to provide a convenient method for testing wafers at high frequencies using standard automatic or manual probe stations. Picoprobe Probe Cards can incorporate our Model 50A probes for RF connections with DC needles for power ａnd low frequency signals.
Multi-Contact Wedges Our unique Multi-Contact Wedge designs accommodate multiple RF ａnd DC contacts on a single, compact adapter. This compact design provides the user with a convenient method for testing wafers at high frequencies using standard automatic or manual probe stations. The user can choose from a variety of wiring options for the DC or power needles ａnd ｓelect any combination of 40, 50, 67, and/or 110 GHz RF probes. |
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Model 50A - configuration - pitch - mounting style
| Configuration: Specify GSG, GS or SG for tip placement where S is the signal tip ａnd G is a ground tip. Use the following diagram to determine the appropriate configuration. Pitch: Specify ground (G) to signal (S) tip spacing in Microns from 50 to 1250 microns. For standard GSG probes, the two spacings are equal. Contact the factory for spacings larger than 1250 microns or unusual tip placement ａnd spacings. |  |
| FIGURE 3 |
Mounting Style: Choose from thirteen adapter styles. Specify T, C, GR, P, DP, EDP, LP, Q, F, S, DS, VP, or RVP. Choose the appropriate mounting type for your application. The P, DP, EDP, LP, Q, S, DS, VP, ａnd RVP styles have the connector pointing back at a 45 degree angle to give more working area above the probe. The DP, EDP, DS, VP, ａnd RVP styles are used where extra clearance beneath the probe is needed. When using DP, EDP, ａnd DS style probes, probe positioning is more difficult due to the increased probing angle since the probe points slide further forward for a given change in the Z axis than our other style probes. Custom mounting styles are available
Example:A 50A-GSG-150-P is a Model 50A with Ground, Signal, Ground configuration with 150 microns between each contact mounted in a P style adaptor.
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公司简介
深圳市森东宝科技有限公司(Cindbest)是香港森东宝国际有限公司在大陆的全资子公司，其致力于半导体技术的共享事业，专注于促进ZG半导体行业的快速成长，以为客户提供性价比的测试系统为使命。
森东宝目前设有半导体仪器营销事业部和半导体设备制造工厂。自主研发CINDBEST品Pai探针台、激光修复仪、探针台全部配件、集代理半导体测试仪表的综合型厂家。现以优质的产品性能，高标准的售后服务迎得客户的广泛认可，是行业内值得信赖的产品供应与服务商。
深圳市森东宝科技有限公司现服务于60多家研究所和高校。与高校、研究所、考古、半导体电子检测等领域有着稳定的合作关系。
合作过的部分客户： 清华大学、北京大学、南京邮电大学、中山大学、华侨大学、深圳大学、湖北大学、燕山大学、ZG矿业大学、西北大学、华南师范大学、苏州大学、北京理工大学、上海师范大学、山东大学、华中科技大学、厦门大学、南京航空航天大学、北京航空航天大学、清华大学深圳研究生院、北京大学深圳研究生院、上海交大密西根学院、江南大学、东南大学、中科院物理所、中科院半导体所、中电48所、中电38所等。
